ETS2 Preliminary Agenda
The preliminary program is also available as a PDF document
Chairs: Rene Segers (ReSeCo, NL), Matteo Sonza-Reorda (Politecnico di Torino, I), Stefan Eichenberger (NXP, D)
ETS2 is a new initiative to be held for the first time during ETS2014. The ETS2 sessions are characterized by an industrial focus and by flexibility and informality. Consequently, the agenda as listed below is subject to change. During the actual day there may be a switch from one topic to another, and back, depending on the discussions. Also the order of the listed presentations may change, even on the fly.
The main goal is to have a lively discussion on the topics, on the presentations. The ETS2 should act as a podium to discuss both problems as well as potential solutions, in order to motivate all involved, industry and academia, to move forward in the broad area of Test.
11:00 - 12:30 ETS2 – Part I
Automotive (Test) Experiences and Requirements in NXP
Robert van Rijsinge (NXP)
The Importance of Reliable Data
Andre van de Geijn (Salland Engineering)
Testing for Yield Learning, THE added value of Test
Thomas Hermann (GLOBALFOUNDRIES)
DPCV - Direct Probe Product Characterization Vehicle Applications, Methodology and Benefits
Bala Murugan, Meindert Lunenborg (PDF Solutions, USA)
12:30 - 14:00 Lunch
14:00 - 15:30 ETS2 – Part II
Telecom (Test) Requirements and Experiences in Huawei
Xinli Gu (Huawei)
Analog DfT & Test, Experiences and Outlook in AMD
Jeff Rearick (AMD)
Analog DfT & Test, Experiences and Outlook, pov from an EDA company
Steve Sunter (Mentor Graphics)
Analog DfT & Test : implementing analog Iddq
Pete Sarson (AMS)
15:30 - 16:00 Coffee Break
16:15 - 17:45 ETS2 – Part III
Analog DfT/Test Experiences in Freescale
Helmut Lang (Freescale)
NFF, No Failures Found, How to Learn from them
Artur Jutman (Testonica)
A New Way to Catch Defects that Escape Production Test but Show Up in SLT or as RMA
Harry Chen (Mediatek)
Operational Test Business in Europe
Frederic Mauron (Aptasic)
